Gambino, Jeffrey - CEI-Europe

Gambino, Jeffrey

PhD, IBM Microelectronics, Essex Junction, Vermont, USA.

Dr. Gambino received the B.S. degree in materials science from Cornell University, Ithaca, NY, in 1979, and the PhD degree in materials science from the Massachusetts Institute of Technology, Cambridge, MA, in 1984.

He joined IBM, Hopewell Junction, NY, in 1984, where he worked on silicide processes for Bipolar and CMOS devices. In 1992, he joined the DRAM development alliance at IBM's Advanced Semiconductor Technology Center, Hopewell Junction, NY. While there, he developed contact and interconnect processes for 0.25-, 0.175-, and 0.15-um DRAM products. In 1999, he joined IBM's manufacturing organization in Essex Junction, VT, where he has worked on copper interconnect processes for CMOS logic technology. He has published over 90 technical papers and holds over 100 patents.

Dr. Gambino has been a member of the CEI-Europe faculty since 2007.

Course #36 Silicon Device Technology: Materials and Processing Overview

Course #95 Copper Low k Interconnect Technology: Processing and Reliability of Cu Low k Interconnect Metallization

Course #65 Megafunction Electronics and Photonics Based on 3D Integration
Applications for 3D Si-based ICs, Flexible Polymer Electronics, 
Thin Film Solar Cells and OLEDs

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