Ph.D. Intel Fellow, Director of Logic Technology Quality
and Reliability
Intel Corporation, Hillsboro, OR, USA.
Dr. Maiz joined Intel Corporation in 1983 and has worked on all
aspects of quality and reliability for 11 generations of silicon
technology at many responsibility levels. He is presently
focused in projecting, understanding and helping resolve
reliability challenges for the coming generations, primarily 15 and
11nm technologies.
He received a BSc. in Physics from the University of Navarra in
San Sebastian, Spain. He was awarded a Fulbright Fellowship to
conduct Graduate studies in the US and received the M.Sc. and Ph.D.
degrees in Electrical Engineering from the Ohio State University
respectively. He was named Intel Fellow in 2002 and became an IEEE
Fellow in 2008.
Dr. Maiz has been a member of the CEI-Europe Faculty since
2001.
Course #61 IC Reliability, Yield, Failure Analysis, and
Fault Isolation