Maiz, José A. - CEI-Europe

Maiz, José A.

Ph.D. Intel Fellow, Retired, IEEE Fellow, Hillsboro, OR, USA.

Dr. Maiz joined Intel Corporation in 1983 and has worked on all aspects of quality and reliability for 12 generations of silicon technology at many responsibility levels.

Before he retired in May'2014 he was focused in projecting, understanding and helping resolve reliability challenges for new technology generations, primarily 14 and 10nm technologies. His present interest are in the advances of Silicon technology for novel devices and in the use of semiconductor technology for biomedical applications.

He received a BSc. in Physics from the University of Navarra in San Sebastian, Spain. He was awarded a Fulbright Fellowship to conduct Graduate studies in the US and received the M.Sc. and Ph.D. degrees in Electrical Engineering from the Ohio State University respectively. He was named Intel Fellow in 2002 and became an IEEE Fellow in 2008.

Dr. Maiz has been a member of the CEI-Europe Faculty since 2001.

Course #61 IC Reliability, Yield, Failure Analysis, and Fault Isolation

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