Course #04
Hands-on Characterization of Solid-State Image Sensors
May 7 - 8, 2012
. Amsterdam, The Netherlands
December 3 - 4, 2012
. Amsterdam, The Netherlands
We recommend you to submit your
preliminary or firm registration at least 4 weeks before course
start to ensure a seat on the course.
TECHNOLOGY FOCUS
CMOS image sensors are becoming more and more complicated. In the
mid nineties the devices were simple image sensors, but over the
recent years they have become complete camera systems.
Characterization and evaluation of these highly sophisticated SoC's
(system-on-chip) is no longer straightforward. Furthermore the
pixels of the sensors are becoming extremely small and their
limited size can have negative effects on dynamic range, light
sensitivity, noise and speed. In the context of further
optimization of the imaging functionality, it is of great
importance to have a good understanding of performance-limiting
parameters of the system. These can only be revealed by performing
dedicated measurements on the image sensors and/or on the complete
camera systems. That is what this course is all about: learning to
characterize an imaging system by means of hands-on experience.
COURSE CONTENT AND OBJECTIVES
This is an advanced course focusing on the
characterization and evaluation of solid-state image sensors and
digital cameras. It will be the first course ever in digital
imaging that will be almost solely conducted based on hands-on
experimental equipment.
The theoretical background of the measurements will be explained
first. The participants will then perform the measurements by means
of the hardware and software available in the classroom. To get the
best learning effect the maximum amount of participants will be
limited to 16.
The following equipment will be available:
Commercially available cameras (monochrome and colour), light
sources, power supplies, and standard software tools to grab images
running on laptops. Critical camera performance parameters will be
measured.
WHO SHOULD ATTEND
The course is intended for engineers that already have
some experience in the field. It can be regarded as a continuation
of course #13
Digital Imaging: Image Capturing Image Sensors, Technologies and
Applications and/or course #14
Digital Camera Systems.
Monday
Getting Acquainted
The first session will allow the participants to get familiar with
the equipment present in the classroom. The cameras provided are
all USB compatible, and are making use of standard software
(supplied by the camera manufacturer) to download images into the
computer. The complete concept is designed/optimized in such a way
that everyone can easily work with it. Number crunching, data
plotting, and data extraction will be done by commercially
available software tools.
The very first measurements we perform together to become familiar
with two important evaluation methods: measuring/calculating
temporal noise and measuring/calculating fixed-pattern noise.
After the introductory session, the group of participants will be
split in sub-groups to give everyone exposure to the hands-on
experience.
Measurements in Dark
It is astonishing how many parameters of a sensor/camera
that can be measured without any light input. The photodiodes
of the image sensors are collecting charges and in principle it
does not matter whether these charges are being generated by
photons or whether they come through leakage in the structure. Once
a charge packet is collected in a photodiode, it can be used to
characterize the imager!
By means of dedicated dark measurements the following parameters
can be evaluated:
- Dark Current Density
- Dark-current Non-uniformities
- Linearity
- Conversion Gain
- Dark Reference Lines/Pixels
- Leaking Pixels
- Temporal Noise
- Dynamic Range
Tuesday
Measurements with Light
Image sensors and cameras are being developed to convert incoming
photons into a measurable quantity. Therefore, it is also of great
importance to evaluate the light characteristics of the devices.
Parameters that can be measured when photons are impinging on the
sensor are:
- Light sensitivity
- Light non-uniformities
- Linearity
- Conversion gain
- Blooming characteristics
- Black sun
- Green-green differences
- Reciprocity effect
- Saturation level
Different participant subgroups will work on different set-ups,
not necessarily performing the same measurements. However, at the
end of the course, everyone will get copies of the outcome of all
characterizations performed by the groups.
Said about the course
from previous participants:
"The course offers the opportunity for image sensor
designers the best way to evaluate a sensor."
"Clear explanations. Interactivity."
"You could directly see results."
"I learned several practical aspects of the CMOS imager
characterization process."
"Good idea to get hands-on experience with image testing
methods."