Professor Albert J.P Theuwissen, Delft University of Technology, the Netherlands, Harvest Imaging, Belgium.
Characterization of Noise with Light
In the third and last part of the course, the image sensor will be characterized with light input. First the fixed-pattern noise (= correlated noise) will be measured, and next the temporal noise (= uncorrelated noise) will be characterized. All measurements will be based on an existing camera and with uniform light input. For both noise types, correlated and uncorrelated, some extra statistical operations will allow to split the overall noise characterized into a contribution on row level, on column level and on pixel level. This gives very useful information on where to find the root cause of the noise sources.
The course includes:
- 126 minutes on-demand video
- 34 modules
- 3 months access
This course is the third part of a series of three e-Learning courses about Image Sensors. For effective training benefit, we recommend also attending course 601 Introduction to Correlated and Uncorrelated Noise in Imagers and course 602 Characterization of Noise in Dark.
Get a better price when ordering all three courses: Bundle 601-603 Advanced Course in Image Sensors and Digital Cameras
Professor Albert J.P. Theuwissen
Professor at the Delft University of Technology, the Netherlands and CEO of Harvest Imaging, Belgium.
Dr. Theuwissen has been teaching in more than 100 courses for us since year 1999.
In 2013 he received the Exceptional Service Award of IISS and in 2014 the SEMI Award.
Dr. Theuwissen has been a member of the Continuing Education Institute-Europe Faculty since 1999.